Additional Equipment and Spare Parts to Complete DREEBIT Products
Equipment & Supplies
This is a summary of equipment and supplies available to complete various DREEBIT products. The listed items range from spare electron guns for Dresden EBIS / EBIT machines to electronics used for x-ray spectroscopical measurements.
EBIT and EBIS-A Spare Guns for Quick Cathode Replacement
EBIS and EBIT cathodes have a limited lifetime and need to be replaced after several thousand hours of source operation. A spare electron gun with a readily installed new cathode can be used for instantaneous replacement to have the ion source back in operation as quick as possible.
Apertures for Charged Particle Beam Formation or Diagnostics
Charged particle beam apertures can be used for several applications, for instance as entrance apertures for Faraday Cups, as cut-off apertures to reduce or form the particle beam sizes or as masks for irradiation of targets.
Pepperpot Masks are multi-hole masks to separate particle beams into multiple beamlets. Particle beam separation is used in pepperpot devices to measure the transversal momentum distribution of incident particle beams and the beam emittance as well as for special cases of target irradiation.
The TERX detection system combined with an appropriate x-ray detector is used to measure x-ray spectra at Electron Beam Ion Sources in dependence on the ionisation time and in dependence on the electron energy.