Dresden EBIS-A and Dresden EBIT at University of Duisburg-Essen
At University Duisburg-Essen, a Dresden EBIS-A as well as a Dresden EBIT are used for studying ion-surface interactions such as nano-scale energy transport and dissipation processes in two-dimensional materials after strong, localized electronic excitations induced by highly charged ion impact.
Electron Beam Ion Sources for Nanoscale Ion-Surface Interaction Studies
Client: Universität Duisburg-Essen
Date of launch: Feb, 2016
Place: Duisburg, Germany
The work group of Prof. Marika Schleberger at University Duisburg-Essen studies nano-scale energy transport and dissipation processes in two-dimensional materials, e.g. graphene, single layer MoS2, or single layer hexagonal BN, after strong, localized electronic excitations. Such systematically modified 2D materials are foreseen to play an important in future electronic devices.
For their work, the group uses highly charged ions (HCI) extracted from a Dresden EBIS-A as projectiles to investigate the effects of the HCI's kinetic and potential energy on energy dissipation in the targets. As a result, detailed information on fundamental mechanisms of ion-surface interaction can be gained to establish new methods for the controlled modification of the surfaces and 2D materials.
Before the new EBIS-A facility went on-line, the group had already been using a Dresden EBIT for their experiments. Along with the installation of the EBIS-A, the EBIT facility was upgraded and is now combined with a Wien filter also designed and manufactured by DREEBIT.
M. Karlušić, R. Kozubek, H. Lebius, B. Ban-d'Etat, R. A. Wilhelm, M. Buljan, Z. Siketić, F. Scholz, T. Meisch, M. Jakšić, S. Bernstorff, M. Schleberger,B. Šantić: "Response of GaN to energetic ion irradiation: conditions for ion track formation", J. Phys. D: Appl. Phys. 48, p. 325304 (2015)
D.A. Kovács, T. Peters, C. Haake, A. Wucher, M. Schleberger, A. Golczewski, F. Aumayr, D. Diesing: "Potential electron emission induced by multiply charged ions in thin film tunnel junctions", Phys. Rev. B 77, p. 245432 (2008)